Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6677774 | Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester | Patrick H. Buffet, Douglas C. Heaberlin, Yu Sun | 2004-01-13 |
| 6675323 | Incremental fault dictionary | Thomas Bartenstein, Douglas C. Heaberlin, Leendert M. Huisman, Thomas F. Mechler, Glen E. Richard +1 more | 2004-01-06 |