Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6785413 | Rapid defect analysis by placement of tester fail data | Kevin J. Barcomb, Kevin C. Quandt | 2004-08-31 |
| 6721914 | Diagnosis of combinational logic circuit failures | Thomas Bartenstein, Douglas C. Heaberlin | 2004-04-13 |
| 6675323 | Incremental fault dictionary | Thomas Bartenstein, Douglas C. Heaberlin, Thomas F. Mechler, Leah Pastel, Glen E. Richard +1 more | 2004-01-06 |