Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6836865 | Method and apparatus for facilitating random pattern testing of logic structures | Mary P. Kusko, William V. Huott, Timothy Charest | 2004-12-28 |
| 6751765 | Method and system for determining repeatable yield detractors of integrated circuits | Richard F. Rizzolo, Rocco E. DeStefano, Joseph Eckelman, Thomas G. Foote, Steven Michnowski +2 more | 2004-06-15 |