Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791084 | Method and scanning electron microscope for measuring dimension of material on sample | Goroku Shimoma, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe, Tadanori Takahashi +3 more | 2004-09-14 |