Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791084 | Method and scanning electron microscope for measuring dimension of material on sample | Goroku Shimoma, Tadashi Otaka, Hideo Todokoro, Shunichi Watanabe, Tadanori Takahashi +3 more | 2004-09-14 |
| 6787772 | Scanning electron microscope | Yoichi Ose, Hideo Todokoro, Makoto Ezumi | 2004-09-07 |
| 6740877 | Scanning electron microscope and sample observation method using the same | Tetsuya Sawahata | 2004-05-25 |