Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822232 | Electronic microscope observation system and observation method | — | 2004-11-23 |
| 6791084 | Method and scanning electron microscope for measuring dimension of material on sample | Goroku Shimoma, Tadashi Otaka, Mitsugu Sato, Shunichi Watanabe, Tadanori Takahashi +3 more | 2004-09-14 |
| 6787772 | Scanning electron microscope | Yoichi Ose, Makoto Ezumi, Mitsugu Sato | 2004-09-07 |