Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822233 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Yuji Sato, Takahito Hashimoto | 2004-11-23 |
| 6794648 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Kazutoshi Kaji, Takashi Aoyama, Shunroku Taya, Hiroyuki Tanaka | 2004-09-21 |
| 6703613 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kaji, Takashi Aoyama, Shunroku Taya | 2004-03-09 |