Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794648 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Takashi Aoyama, Shunroku Taya, Hiroyuki Tanaka, Shigeto Isakozawa | 2004-09-21 |
| 6703613 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Takashi Aoyama, Shunroku Taya, Shigeto Isakozawa | 2004-03-09 |