Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822233 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Hiroshi Kakibayashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto | 2004-11-23 |
| 6750451 | Observation apparatus and observation method using an electron beam | Masanari Koguchi, Kuniyasu Nakamura, Kaoru Umemura, Yoshifumi Taniguchi | 2004-06-15 |