Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6808610 | Capillary array electrophoresis apparatus | Ryoji Inaba, Satoshi Takahashi, Miho Ozawa | 2004-10-26 |
| 6683683 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Shigeru Matsui, Hitoshi Komuro, Kazuo Takeda | 2004-01-27 |