Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6825052 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2004-11-30 |
| 6724209 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Benjamin N. Eldridge | 2004-04-20 |
| 6690185 | Large contactor with multiple, aligned contactor units | Igor Y. Khandros, David V. Pedersen | 2004-02-10 |