Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6825052 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2004-11-30 |
| 6788094 | Wafer-level burn-in and test | Igor Y. Khandros | 2004-09-07 |
| 6766348 | Method and system for load-balanced data exchange in distributed network-based resource allocation | Charles D. Combs, Jeffrey J. Gold, Brian Mair, David Schear | 2004-07-20 |
| 6727580 | Microelectronic spring contact elements | Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2004-04-27 |
| 6690185 | Large contactor with multiple, aligned contactor units | Igor Y. Khandros, Ralph G. Whitten | 2004-02-10 |