Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6830941 | Method and apparatus for identifying individual die during failure analysis | Chern-Jiann Lee, Boon Yong Ang, David Lin | 2004-12-14 |
| 6770495 | Method for revealing active regions in a SOI structure for DUT backside inspection | Boon Yong Ang | 2004-08-03 |
| 6770512 | Method and system for using TMAH for staining copper silicon on insulator semiconductor device cross sections | Mohammad Masoodi, Bryan Tracy | 2004-08-03 |