Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6830941 | Method and apparatus for identifying individual die during failure analysis | Chern-Jiann Lee, David Lin, Mehrdad Mahanpour | 2004-12-14 |
| 6824446 | Method and apparatus for polishing an outer edge ring on a semiconductor wafer | Kenneth R. Harris | 2004-11-30 |
| 6770495 | Method for revealing active regions in a SOI structure for DUT backside inspection | Mehrdad Mahanpour | 2004-08-03 |