CL

Chern-Jiann Lee

AM AMD: 1 patents #442 of 1,035Top 45%
📍 Los Altos, CA: #169 of 438 inventorsTop 40%
🗺 California: #8,555 of 28,370 inventorsTop 35%
Overall (2004): #246,796 of 270,089Top 95%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6830941 Method and apparatus for identifying individual die during failure analysis Boon Yong Ang, David Lin, Mehrdad Mahanpour 2004-12-14