Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6808945 | Method and system for testing tunnel oxide on a memory-related structure | Zhigang Wang, Nian Yang | 2004-10-26 |
| 6716710 | Using a first liner layer as a spacer in a semiconductor device | Nian Yang, Zhigang Wang | 2004-04-06 |
| 6696331 | Method of protecting a stacked gate structure during fabrication | Nian Yang, Zhigang Wang | 2004-02-24 |
| 6689666 | Replacing a first liner layer with a thicker oxide layer when forming a semiconductor device | Nian Yang, Zhigang Wang | 2004-02-10 |