MW

Mike Whelan

VI Verity Instruments: 1 patents #1 of 4Top 25%
Lam Research: 1 patents #78 of 202Top 40%
📍 Coppell, TX: #9 of 36 inventorsTop 25%
🗺 Texas: #2,449 of 8,709 inventorsTop 30%
Overall (2003): #153,403 of 273,478Top 60%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6642063 Apparatus for characterization of microelectronic feature quality Randall S. Mundt, Albert Lamm, Andrew Weeks Kueny 2003-11-04