Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642063 | Apparatus for characterization of microelectronic feature quality | Randall S. Mundt, Mike Whelan, Andrew Weeks Kueny | 2003-11-04 |
AL
Albert Lamm
Verity Instruments: 1 patents #1 of 4Top 25%
Overall (2003): #266,284 of 273,478Top 100%
1
Patents 2003