Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6643354 | Calibration and alignment of X-ray reflectometric systems | Craig E. Uhrich, Jon Opsal | 2003-11-04 |
| 6507634 | System and method for X-ray reflectometry measurement of low density films | William J. Johnson | 2003-01-14 |