Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6613592 | IMD oxide crack monitor pattern and design rule | Chun-Chen Yeh, Jyh-Feng Lin | 2003-09-02 |
| 6541370 | Composite microelectronic dielectric layer with inhibited crack susceptibility | Ming-Tsong Wang, Shi-Wei Wang | 2003-04-01 |