Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6613592 | IMD oxide crack monitor pattern and design rule | Shin-Kai Chen, Chun-Chen Yeh | 2003-09-02 |
JL
Jyh-Feng Lin
Overall (2003): #186,452 of 273,478Top 70%
1
Patents 2003