Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6636313 | Method of measuring photoresist and bump misalignment | Yen-Ming Chen, Chia-Fu Lin, Kai-Ming Ching, Chao-Yuan Su, Li-Chih Chen | 2003-10-21 |
| 6602775 | Method to improve reliability for flip-chip device for limiting pad design | Yen-Ming Chen, Chia-Fu Lin, Kai-Ming Ching, Chao-Yuan Su, Li-Chi Chen | 2003-08-05 |