Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6597193 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Alexander Savtchouk, Marshall D. Wilson | 2003-07-22 |
| 6538462 | Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge | Marshall D. Wilson, Alexander Savtchouk | 2003-03-25 |
| 6512384 | Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages | Vladimir N. Faifer, Andrei Aleinikov | 2003-01-28 |