VF

Vladimir N. Faifer

SD Semiconductor Diagnostics: 1 patents #4 of 6Top 70%
🗺 California: #8,996 of 28,521 inventorsTop 35%
Overall (2003): #95,795 of 273,478Top 40%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6512384 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages Jacek Lagowski, Andrei Aleinikov 2003-01-28