Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6667467 | Microprobe and scanning probe apparatus having microprobe | Nobuhiro Shimizu, Hiroshi Takahashi, Jürgen Brugger, Walter Haberle, Gerd Binnig +1 more | 2003-12-23 |
| 6664540 | Microprobe and sample surface measuring apparatus | Nobuhiro Shimizu, Hiroshi Takahashi, Chiaki Yasumuro | 2003-12-16 |