Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6549022 | Apparatus and method for analyzing functional failures in integrated circuits | Edward I. Cole, Jr., Charles F. Hawkins, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring | 2003-04-15 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Michael R. Bruce, Victoria J. Bruce +4 more | 2003-04-08 |