Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6635839 | Semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, Victoria J. Bruce, Michael R. Bruce +2 more | 2003-10-21 |
| 6599762 | Defect detection using liquid crystal and internal heat source | — | 2003-07-29 |
| 6576195 | Time-lapsed IC defect analysis using liquid crystal | — | 2003-06-10 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring +4 more | 2003-04-08 |