Issued Patents 2003
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6657446 | Picosecond imaging circuit analysis probe and system | Rama R. Goruganthu, Antonio Torres Garcia | 2003-12-02 |
| 6653849 | IC analysis involving logic state mapping in a SOI die | Rama R. Goruganthu | 2003-11-25 |
| 6635839 | Semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, David H. Eppes, Victoria J. Bruce +2 more | 2003-10-21 |
| 6621288 | Timing margin alteration via the insulator of a SOI die | Rama R. Goruganthu | 2003-09-16 |
| 6621281 | SOI die analysis of circuitry logic states via coupling through the insulator | Jeffrey D. Birdsley, Brennan V. Davis, Daniel L. Stone, Rosalinda M. Ring | 2003-09-16 |
| 6608494 | Single point high resolution time resolved photoemission microscopy system and method | Rama R. Goruganthu | 2003-08-19 |
| 6576484 | IC die analysis via back side circuit construction with heat dissipation | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2003-06-10 |
| 6566888 | Repair of resistive electrical connections in an integrated circuit | Glen Gilfeather, Rama R. Goruganthu | 2003-05-20 |
| 6549022 | Apparatus and method for analyzing functional failures in integrated circuits | Edward I. Cole, Jr., Paiboon Tangyunyong, Charles F. Hawkins, Victoria J. Bruce, Rosalinda M. Ring | 2003-04-15 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Victoria J. Bruce, Rosalinda M. Ring +4 more | 2003-04-08 |
| 6541987 | Laser-excited detection of defective semiconductor device | — | 2003-04-01 |
| 6529029 | Magnetic resonance imaging of semiconductor devices | Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis | 2003-03-04 |
| 6518783 | Circuit construction in back side of die and over a buried insulator | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone, Rama R. Goruganthu | 2003-02-11 |