Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Kazunobu Miki | 2003-10-14 |
| 6628127 | Probe card for testing semiconductor integrated circuit and method of manufacturing the same | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Masahiro Tanaka | 2003-09-30 |