Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6667626 | Probe card, and testing apparatus having the same | Megumi Takemoto, Shigeki Maekawa, Yuetsu Watanabe | 2003-12-23 |
| 6646455 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Megumi Takemoto, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata | 2003-11-11 |
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Megumi Takemoto, Shigeki Maekawa, Yoshinori Deguchi, Kazunobu Miki | 2003-10-14 |
| 6628127 | Probe card for testing semiconductor integrated circuit and method of manufacturing the same | Megumi Takemoto, Shigeki Maekawa, Yoshinori Deguchi, Masahiro Tanaka | 2003-09-30 |