Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646455 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Megumi Takemoto, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2003-11-11 |
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi | 2003-10-14 |