Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6534388 | Method to reduce variation in LDD series resistance | Wenhe Lin, Simon Chooi, Kin Leong Pey | 2003-03-18 |
| 6524910 | Method of forming dual thickness gate dielectric structures via use of silicon nitride layers | Wenhe Lin, Kin Leong Pey, Mei Sheng Zhou, Simon Chooi | 2003-02-25 |