MS

Meny Shy

OM Optimet, Optical Metrology: 1 patents #2 of 4Top 50%
📍 Aminadav, IL: #1 of 1 inventorsTop 100%
Overall (2003): #78,455 of 273,478Top 30%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6590654 Polarized illumination and detection for metrological applications Gabriel Y. Sirat, Yaacov Zerem, Valery Deich 2003-07-08