VD

Valery Deich

OM Optimet, Optical Metrology: 1 patents #2 of 4Top 50%
📍 Kiryat Shmona, IL: #2 of 13 inventorsTop 20%
Overall (2003): #97,239 of 273,478Top 40%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6590654 Polarized illumination and detection for metrological applications Gabriel Y. Sirat, Yaacov Zerem, Meny Shy 2003-07-08