GS

Gabriel Y. Sirat

OM Optimet, Optical Metrology: 2 patents #1 of 4Top 25%
Overall (2003): #67,231 of 273,478Top 25%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6667458 Spot size and distance characterization for a laser tool 2003-12-23
6590654 Polarized illumination and detection for metrological applications Yaacov Zerem, Meny Shy, Valery Deich 2003-07-08