JL

James C. Lenk

MM Memc Electronic Materials: 1 patents #24 of 53Top 50%
📍 O'Fallon, MO: #8 of 33 inventorsTop 25%
🗺 Missouri: #367 of 1,513 inventorsTop 25%
Overall (2003): #203,091 of 273,478Top 75%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6649883 Method of calibrating a semiconductor wafer drying apparatus Yoshio Iwamoto, Philip Schmidt, Craig Spohr, Leslie George Stanton 2003-11-18