KM

Konstantin Mogilnikov

IV Interuniversitair Micro-Electronica Centrum Vzw: 1 patents #15 of 67Top 25%
Overall (2003): #176,580 of 273,478Top 65%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6662631 Method and apparatus for characterization of porous films Mikhail Baklanov, Karen Maex, Denis Shamiryan, Fedor Nikolaevich Dultsev 2003-12-16