Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661718 | Testing device for testing a memory | Carsten Ohlhoff | 2003-12-09 |
| 6646937 | Integrated clock generator, particularly for driving a semiconductor memory with a test signal | — | 2003-11-11 |
| 6618836 | Configuration and method for producing test signals for testing a multiplicity of semiconductor chips | — | 2003-09-09 |
| 6601194 | Circuit configuration for repairing a semiconductor memory | Wilfried Dähn | 2003-07-29 |
| 6556492 | System for testing fast synchronous semiconductor circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2003-04-29 |
| 6542430 | Integrated memory and memory configuration with a plurality of memories and method of operating such a memory configuration | — | 2003-04-01 |
| 6535009 | Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level | — | 2003-03-18 |
| 6515319 | Field-effect-controlled transistor and method for fabricating the transistor | Dietrich Widmann, Armin Wieder, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2003-02-04 |