Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6618305 | Test circuit for testing a circuit | Wolfgang Ernst, Peter Poechmueller, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2003-09-09 |
| 6612738 | Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configuration | Peter Beer, Manfred Dobler | 2003-09-02 |
| 6581171 | Circuit configuration for the burn-in test of a semiconductor module | — | 2003-06-17 |
| 6556492 | System for testing fast synchronous semiconductor circuits | Wolfgang Ernst, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more | 2003-04-29 |