Issued Patents 2003
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6669489 | Interposer, socket and assembly for socketing an electronic component and method of making and using same | Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2003-12-30 |
| 6664628 | Electronic component overlapping dice of unsingulated semiconductor wafer | David V. Pedersen, Benjamin N. Eldridge, Richard S. Roy, Gaetan L. Mathieu | 2003-12-16 |
| 6655023 | Method and apparatus for burning-in semiconductor devices in wafer form | Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2003-12-02 |
| 6642625 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu, David V. Pederson +1 more | 2003-11-04 |
| 6624648 | Probe card assembly | Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2003-09-23 |
| 6621260 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten | 2003-09-16 |
| 6615485 | Probe card assembly and kit, and methods of making same | Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2003-09-09 |
| 6603324 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten | 2003-08-05 |
| 6597187 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten | 2003-07-22 |
| 6551844 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten | 2003-04-22 |
| 6538214 | Method for manufacturing raised electrical contact pattern of controlled geometry | — | 2003-03-25 |
| 6534856 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu, David V. Pedersen +1 more | 2003-03-18 |
| 6525555 | Wafer-level burn-in and test | David V. Pedersen | 2003-02-25 |
| 6520778 | Microelectronic contact structures, and methods of making same | Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2003-02-18 |