BE

Benjamin N. Eldridge

FO Formfactor: 17 patents #1 of 17Top 6%
📍 Danville, CA: #1 of 111 inventorsTop 1%
🗺 California: #56 of 28,521 inventorsTop 1%
Overall (2003): #390 of 273,478Top 1%
17
Patents 2003

Issued Patents 2003

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu 2003-12-30
6664628 Electronic component overlapping dice of unsingulated semiconductor wafer Igor Y. Khandros, David V. Pedersen, Richard S. Roy, Gaetan L. Mathieu 2003-12-16
6657455 Predictive, adaptive power supply for an integrated circuit under test Charles A. Miller 2003-12-02
6655023 Method and apparatus for burning-in semiconductor devices in wafer form Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu 2003-12-02
6640432 Method of fabricating shaped springs Gaetan L. Mathieu, Stuart Wenzel 2003-11-04
6642625 Sockets for “springed” semiconductor devices Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, David V. Pederson +1 more 2003-11-04
6627980 Stacked semiconductor device assembly with microelectronic spring contacts 2003-09-30
6624648 Probe card assembly Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu 2003-09-23
6621260 Special contact points for accessing internal circuitry of an integrated circuit Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten 2003-09-16
6616966 Method of making lithographic contact springs Gaetan L. Mathieu, Gary W. Grube 2003-09-09
6615485 Probe card assembly and kit, and methods of making same Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu 2003-09-09
6603324 Special contact points for accessing internal circuitry of an integrated circuit Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten 2003-08-05
6597187 Special contact points for accessing internal circuitry of an integrated circuit Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten 2003-07-22
6551844 Test assembly including a test die for testing a semiconductor product die Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten 2003-04-22
6534856 Sockets for “springed” semiconductor devices Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, David V. Pedersen +1 more 2003-03-18
6520778 Microelectronic contact structures, and methods of making same Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu 2003-02-18
6509751 Planarizer for a semiconductor contactor Gaetan L. Mathieu, Gary W. Grube 2003-01-21