Issued Patents 2003
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6665701 | Method and system for contention controlled data exchange in a distributed network-based resource allocation | Charles D. Combs, Jeffrey J. Gold, Brian Mair, David Schear | 2003-12-16 |
| 6664628 | Electronic component overlapping dice of unsingulated semiconductor wafer | Igor Y. Khandros, Benjamin N. Eldridge, Richard S. Roy, Gaetan L. Mathieu | 2003-12-16 |
| 6644982 | Method and apparatus for the transport and tracking of an electronic component | Douglas S. Ondricek | 2003-11-11 |
| 6640415 | Segmented contactor | Mohammad Eslamy, Harry D. Cobb | 2003-11-04 |
| 6627483 | Method for mounting an electronic component | Douglas S. Ondricek | 2003-09-30 |
| 6621260 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2003-09-16 |
| 6603324 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2003-08-05 |
| 6597187 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2003-07-22 |
| 6551844 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2003-04-22 |
| 6534856 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu +1 more | 2003-03-18 |
| 6525555 | Wafer-level burn-in and test | Igor Y. Khandros | 2003-02-25 |
| 6523065 | Method and system for maintenance of global network information in a distributed network-based resource allocation system | Charles D. Combs, Jeffrey J. Gold, Brian Mair, David Schear | 2003-02-18 |