Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6624891 | Interferometric-based external measurement system and method | Jiann-Rong Lee, Donald R. Lowry, Timothy M. Trembley | 2003-09-23 |
| 6614534 | Method and apparatus for combined measurement of surface non-uniformity index of refraction variation and thickness variation | Jiann-Rong Lee, Donald A. Stephenson, Thomas F. Kaltenbach | 2003-09-02 |
| 6587209 | Measurement method and apparatus of an external digital camera imager assembly | Eric A. Dilella, Jiann-Rong Lee, Donald R. Lowry, Timothy M. Trembley | 2003-07-01 |
| 6587210 | Measurement method and apparatus of an external digital camera imager assembly | Eric A. Dilella, Jiann-Rong Lee, Donald R. Lowry, Timothy M. Trembley | 2003-07-01 |
| 6558735 | Reusable mass-sensor in manufacture of organic light-emitting devices | Anna L. Hrycin, Steven A. Van Slyke | 2003-05-06 |
| 6522410 | Method for processing low coherence interferometric data | Jiann-Rong Lee | 2003-02-18 |
| 6513451 | Controlling the thickness of an organic layer in an organic light-emiting device | Steven A. Van Slyke, John P. Spoonhower, Robert G. Spahn, Dennis R. Freeman | 2003-02-04 |
| 6512587 | Measurement method and apparatus of an external digital camera imager assembly | Eric A. Dilella, Jiann-Rong Lee, Donald R. Lowry, Timothy M. Trembley | 2003-01-28 |