Issued Patents 2003
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6624891 | Interferometric-based external measurement system and method | Michael A. Marcus, Donald R. Lowry, Timothy M. Trembley | 2003-09-23 |
| 6614534 | Method and apparatus for combined measurement of surface non-uniformity index of refraction variation and thickness variation | Michael A. Marcus, Donald A. Stephenson, Thomas F. Kaltenbach | 2003-09-02 |
| 6587209 | Measurement method and apparatus of an external digital camera imager assembly | Michael A. Marcus, Eric A. Dilella, Donald R. Lowry, Timothy M. Trembley | 2003-07-01 |
| 6587210 | Measurement method and apparatus of an external digital camera imager assembly | Michael A. Marcus, Eric A. Dilella, Donald R. Lowry, Timothy M. Trembley | 2003-07-01 |
| 6522410 | Method for processing low coherence interferometric data | Michael A. Marcus | 2003-02-18 |
| 6512587 | Measurement method and apparatus of an external digital camera imager assembly | Michael A. Marcus, Eric A. Dilella, Donald R. Lowry, Timothy M. Trembley | 2003-01-28 |