Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6654489 | Apparatus and methods for collecting global data during a reticle inspection | James Wiley, Jun Ye, Shauh-Teh Juang, David Alles, Yen-Wen Lu | 2003-11-25 |
| 6567960 | System for improving circuit simulations by utilizing a simplified circuit model based on effective capacitance and inductance values | Norman Chang, Osamu Nakagawa, Shen Lin, Weize Xie | 2003-05-20 |
| 6516085 | Apparatus and methods for collecting global data during a reticle inspection | James Wiley, Jun Ye, Shauh-Teh Juang, David Alles, Yen-Wen Lu | 2003-02-04 |