Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6654489 | Apparatus and methods for collecting global data during a reticle inspection | James Wiley, Jun Ye, David Alles, Yen-Wen Lu, Yu Cao | 2003-11-25 |
| 6529621 | Mechanisms for making and inspecting reticles | Lance Glasser, Jun Ye, David Alles, James Wiley | 2003-03-04 |
| 6516085 | Apparatus and methods for collecting global data during a reticle inspection | James Wiley, Jun Ye, David Alles, Yen-Wen Lu, Yu Cao | 2003-02-04 |