WP

Wilfred Pau

Applied Materials: 1 patents #371 of 884Top 45%
🗺 California: #8,996 of 28,521 inventorsTop 35%
Overall (2003): #91,634 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6635573 Method of detecting an endpoint during etching of a material within a recess Meihua Shen, Jeffrey D. Chinn 2003-10-21