Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6453437 | Method and system for performing transition fault simulation along long circuit paths for high-quality automatic test pattern generation | Rohit Kapur, Thomas W. Williams, Peter Wohl | 2002-09-17 |
| 6385750 | Method and system for controlling test data volume in deterministic test pattern generation | Rohit Kapur, Thomas W. Williams, Peter Wohl | 2002-05-07 |