TK

Toshio Kodama

SI Seiko Instruments: 1 patents #121 of 259Top 50%
Overall (2002): #100,179 of 266,432Top 40%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6489612 Method of measuring film thickness Yasuhiko Sugiyama, Toshiaki Fujii 2002-12-03