Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6499340 | Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope | Masatoshi Yasutake, Akira Inoue, Ryuichi Matsuzaki, Gerd Binnig, Walter Haeberle | 2002-12-31 |